Measuring Volterra Kernels of Analog To Digital Converters Using a Stepped Three-Tone Scan

• The Volterra theory can be used to mathematically model nonlinear dynamic components such as analog-to-digital converters (ADCs). This paper describes how frequency-domain Volterra kernels of an ADC are determined from measurements. The elements of the Volterra theory are given, and practical issues are considered, such as methods for signal conditioning and finding the appropriate test signals scenario and suitable sampling frequency. The results show that, for the used pipeline ADC, the frequency dependence is significantly stronger for second-order difference products than for sum products and the linear frequency dependence was not as pronounced as that of the second-order Volterra kernel. It is suggested that the Volterra kernels have the symmetry properties of a specific box model, namely, the parallel Hammerstein system.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

Keyword

analog-to-digital converter (ADC)

measurements

test

Volterra kernels

Telecommunication

Telekommunikation

Electronics

Publication and Content Type

ref (subject category)

art (subject category)